Teradyne's DFT (Design for Testability) Software Group is developing a
software system that enables semiconductor manufacturers to exploit
DFTtechnologies in order to reduce test costs, accelerate time to
market, and enhance yield. However, to make the best use of DFT,
semiconductor manufacturers must also be able to easily manage and
interpret the automatically generated test results along with existing
semiconductor design information and new information produced by DFT
diagnosis tools. This Clinic team created a Java and XML/XSLT based
system to meet this need.